Kestrel 200 Optical Measuring Microscope
Overview
Vision Engineering's Kestrel 200 optical measuring microscope provides fast and accurate 2-axis measurement of precision component parts. 
From simple manual, single-feature operation to more complex component part measurement, Kestrel 200 combines high resolution, high contrast optical images with an intuitive microprocessor to deliver accuracy and simplicity for a wide range of measuring applications. The superior optical image of Kestrel even allows difficult-to-view features to be measured on low contrast components, such as black or transparent plastics.
· 2-axis non-contact measurement
· Patented optical image clearly defines edges, offering superb resolution and contrast
· Powerful and intuitive microprocessor delivers simple, fast results
· Image capture option
· High accuracy, low investment system
Intuitive Microprocessor
Kestrel 200 is the smallest member of the Vision Engineering optical measurement range, with a 150mm x 100mm stage making it ideal for measuring 2-D features of small, intricate parts. Data processing is performed by a QC-200 multi-function microprocessor and has been designed with ease of use in mind.
The intuitive QC-200 software can be used by shift workers or advanced users and accommodates English, French, German, Italian, Portuguese, Spanish, Swedish, Czech, Polish, Turkish, Japanese and Chinese languages.
Technical:
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Kestrel 200
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Magnification Options
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x10, x20*, x50
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Surface Illumination Options
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60W semi-coaxial spot lamps*
8-point LED ringlight
100W episcopic (through the lens)
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Substage Illumination
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30W substage
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Data Processor Options
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QC-200*, QC-300
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* standard option
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Measuring Range
X
Y
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150mm
100mm
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Measurement Uncertainty
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U952D = 7+(6.5L/1000)µm**
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Maximum Glass Plate Load
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10kg
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Encoder Resolution
X
Y
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1.0µm
1.0µm
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Stage Repeatability
X
Y
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0.005mm
0.005mm
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**
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Where L = measured length in mm (x50 system magnification, controlled 20°C, using traceable chrome on glass grid artefact, with intersection points at the standard measuring plane).
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